Asylum Research
 
 

Cypher S

Not sure where to start? See our product line overview brochure.

 

Latest News

Oxford Instruments Asylum Research Launches a New Online Probe Store for Purchasing Atomic Force Microscopy Probes

New Application Note Describes Atomic Force Microscopy Tools for Nanoscale Electrical Characterization

Oxford Instruments Asylum Research Announces the Cypher ES Polymer Edition, an Atomic Force Microscope Optimized for Polymer Research

See More News

New Application Notes, Datasheets, and Articles

AFM Tools for Nanoscale Electrical Characterization

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

AFM Applications in Polymer Science and Engineering

Cypher ES Polymer Edition

Contact Resonance Viscoelastic Mapping Mode

 

Workshops, Talks and Tutorials

BiPoCo, August 28-1
"Nanomechanical and viscoelastic measurements in biological Atomic Force Microscopy (AFM)"

2016 Fuerzas y Tunel (FyT2016), Sept 5-7
"Quantitative nanomechanical AFM characterization of polymers using fast and versatile AM-FM Mode"

Materials Science and Engineering (MSE), Septt 27-29
“Quantitative Measurements of Electromechanical Response with Interferometric Atomic Force Microscopy”


Contact us to schedule a live demo at one of our upcoming shows!

For additional details, see our events page

Webinars

How to Choose the Right AFM Probe, Sept 8, 8am PDT

More than Just Roughness: AFM Techniques for Thin Film Analysis

Beyond Topography: New Advances in AFM Characterization of Polymers

Piezoresponse Force Microscopy: From Theory to Advanced Applications: Two-part Webinar Series


 

Asylum Research • 6310 Hollister Ave. • Santa Barbara, CA 93117 • 888-472-2795805-696-6466 voice • 805-696-6444 fax • info@AsylumResearch.com

 

Cypher Cypher