Asylum Research

Cypher S

Not sure where to start? See our product line overview brochure.


Latest News

Oxford Instruments Asylum Research Launches a New Online Probe Store for Purchasing Atomic Force Microscopy Probes

Oxford Instruments Asylum Research in conjunction with Materials Today presents the webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis” on June 1, 2016 at 11:00am EDT

Oxford Instruments Asylum Research and McGill University
Announce the McGill AFM Summer School and Workshop, May 12-13, 2016

Oxford Instruments Asylum Research Announces the Cypher ES Polymer Edition, an Atomic Force Microscope Optimized for Polymer Research

Oxford Instruments Asylum Research Cypher Atomic Force Microscopes Chosen By Leading Polymer Science Research and Engineering Laboratories

Atomic Force Microscopes from Asylum Research Guide the Development of Thin Film Deposition and Etch Processes

See More News

New Application Notes, Datasheets, and Articles

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

GetStarted™: Simple, high quality tapping mode images from the first scan line

The NanomechPro™ Toolkit - Nanomechanical AFM Techniques for Diverse Materials

AFM Applications in Polymer Science and Engineering

AM-FM Viscoelastic Mapping Mode

blueDrive™ Photothermal Exicitation

Contact Resonance Viscoelastic Mapping Mode

GetReal™ Automated Probe Calibration

Graphene and other low-dimensional materials


Workshops, Talks and Tutorials

ACS Fall Meeting, August 21-23, Booth# 1215
"Quantitative Measurements of Electromechanical Response with Interferometric Atomic Force Microscopy"
Dr. Marta Kocun

Contact us to schedule a live demo at one of our upcoming shows!

For additional details, see our events page


Oxford Instruments Asylum Research • Borsigstrasse 15a, 65205 • Wiesbaden, Germany
Voice +49-0612-2937-0 • Fax +49-0612-2937-190 •


Cypher Cypher