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Oxford Instruments Asylum Research Launches a New Online Probe Store for Purchasing Atomic Force Microscopy Probes
New Application Note Describes Atomic Force Microscopy Tools for Nanoscale Electrical Characterization
Oxford Instruments Asylum Research Announces the Cypher ES Polymer Edition, an Atomic Force Microscope Optimized for Polymer Research
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New Application Notes, Datasheets, and Articles
AFM Tools for Nanoscale Electrical Characterization
AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties
AFM Applications in Polymer Science and Engineering
Cypher ES Polymer Edition
Contact Resonance Viscoelastic Mapping Mode
Workshops, Talks and Tutorials
BiPoCo, August 28-1
"Nanomechanical and viscoelastic measurements in biological Atomic Force Microscopy (AFM)"
2016 Fuerzas y Tunel (FyT2016), Sept 5-7
"Quantitative nanomechanical AFM characterization of polymers using fast and versatile AM-FM Mode"
Materials Science and Engineering (MSE), Septt 27-29
“Quantitative Measurements of Electromechanical Response with Interferometric Atomic Force Microscopy”
Contact us to schedule a live demo at one of our upcoming shows!
For additional details, see our events page
How to Choose the Right AFM Probe, Sept 8, 8am PDT
More than Just Roughness: AFM Techniques for Thin Film Analysis
Beyond Topography: New Advances in AFM Characterization of Polymers
Piezoresponse Force Microscopy: From Theory to Advanced Applications: Two-part Webinar Series