Not sure where to start? See our product line overview brochure.
Oxford Instruments Asylum Research in conjunction with Materials Today presents the webinar: “More Than Just Roughness: AFM Techniques for Thin Film Analysis” on June 1, 2016 at 11:00am EDT
Oxford Instruments Asylum Research and McGill University
Announce the McGill AFM Summer School and Workshop, May 12-13, 2016
Oxford Instruments Asylum Research Announces the Cypher ES Polymer Edition, an Atomic Force Microscope Optimized for Polymer Research
Oxford Instruments Asylum Research Cypher Atomic Force Microscopes Chosen By Leading Polymer Science Research and Engineering Laboratories
Atomic Force Microscopes from Asylum Research Guide the Development of Thin Film Deposition and Etch Processes
See More News
New Application Notes, Datasheets, and Articles
AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties
GetStarted™: Simple, high quality tapping mode images from the first scan line
The NanomechPro™ Toolkit - Nanomechanical AFM Techniques for Diverse Materials
AFM Applications in Polymer Science and Engineering
AM-FM Viscoelastic Mapping Mode
blueDrive™ Photothermal Exicitation
Contact Resonance Viscoelastic Mapping Mode
GetReal™ Automated Probe Calibration
Graphene and other low-dimensional materials
Workshops, Talks and Tutorials
ACS Fall Meeting, August 21-23, Booth# 1215
"Quantitative Measurements of Electromechanical Response with Interferometric Atomic Force Microscopy"
Dr. Marta Kocun
Contact us to schedule a live demo at one of our upcoming shows!
For additional details, see our events page